AFTE Store - Comparison Scanning Electron Microscopy in Forensic Science: from the Beginning of the Electron Microscopy towards Comparison-Variable Pressure-SEM Imaging in Firearms and Tool Marks Examinations

A development in Variable Pressure-Scanning Electron Microscopy (VP-SEM) allows the observation of objects suspended in a gas phase, with a good resolution and a good signal to noise ratio. The purpose of the present contribution is to highlight the main advances of the comparison scanning electron microscope from the beginning such as a paper about a conventional comparison scanning electron microscope (presented during the AFTE conference in Denver 1981) showed to the actual development of the Comparison VP-SEM technique for application in forensic science, especially in firearms and tool marks comparison examinations.