AFTE Store - Firearms Examinations by Scanning Electron Microscopy: Observations and an Update of Current and Future Approaches

The use of scanning electron microscopy (SEM) in the examination of firearms evidence was introduced in the litereature over twenty years ago. Due to cost and convenience factors, however, scanning electron microscopy has remained largely inaccessible and therefore under-exploited in the firearms community. We will review the significant advantages of SEM in the examination of firearms evidence and present information on recent and future improvements in methodology which make this approach more attractive and available to forensic laboratories.

$5.00

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